Tag: Piezo

Precision Positioning of Samples and Objectives

The Key to Successful Microscoping

Whether classical stereo microscopy, fluorescent, widefield or laser scanning microscopy, whether SEM, FIB-SEM, TEM, AFM or correlative microscopy - positioning samples and objectives with subnanometer precision is decisive for the quality of your results with all of these techniques. This fully clickable, new “Nanopositioning for Microscopy” brochure provides a comprehensive overview of objective scanners and sample stages with up to six degrees of motion freedom – illustrated by a variety of today’s microscopy techniques.

더 보기

Precision Motion and Positioning due to High-Resolution Measuring Technology

External Interferometer vs. Internal Sensor

Read more on „Controlling PI Positioners with External Zygo Interferometer“ in the new whitepaper!

더 보기

Positioning Heavy Loads with Nanometer Precision over Long Travel Ranges

Is That Feasible?

Hybrid drives combine two different drive concepts into a high-performance and precision positioning system. They take advantage of both drives. These types of solutions are always in demand when one drive alone is not in a position to meet all of the requirements of applications. An example of this is nanometer-precision positioning of heavy loads over long travel ranges. Nanopositioning systems that combine piezo drives with classical drive screws therefore offer a practical solution, but also other drive concepts are possible.

더 보기