PIFOC® Objective & PInano® Sample Scanners for Microscopy

Piezo flexure stages and objective scanners of the PIFOC® and PInano® series offer high dynamics in positioning and scanning tasks. Well adapted solutions for XY specimen positioning parallel and vertical to the optical axis and Z focusing of the objective are available as standard products.

Stages are also available conveniently in a system together with controller and all required connecting cables and software. Like all piezo systems, microscopy stages and scanners are delivered precalibrated with measurement log.